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Crosstalk in SiC Power MOSFETs for Evaluation of Threshold Voltage Shift Caused by Bias Temperature Instability (2019)

First Author: Gonzalez J

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.23919/epe.2019.8915508

Publication URI: http://dx.doi.org/10.23919/epe.2019.8915508

Type: Conference/Paper/Proceeding/Abstract