Model-driven photometric stereo for in-process inspection of non-diffuse curved surfaces (2019)

First Author: Ren M

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.cirp.2019.04.013

Publication URI: http://dx.doi.org/10.1016/j.cirp.2019.04.013

Type: Journal Article/Review

Parent Publication: CIRP Annals

Issue: 1