On-machine and in-process surface metrology for precision manufacturing (2019)

First Author: Gao W
Attributed to:  Revisiting optical scattering with machine learning (SPARKLE) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.cirp.2019.05.005

Publication URI: http://dx.doi.org/10.1016/j.cirp.2019.05.005

Type: Journal Article/Review

Parent Publication: CIRP Annals

Issue: 2