Mitigating Local Over-fitting During Single Particle Reconstruction with SIDESPLITTER (2019)

First Author: Ramlaul K

Attributed to: Collaborative Computational Project for Electron cryo-Microscopy (CCP-EM): Supporting the software infrastructure for cryoEM techniques. funded by MRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1101/2019.12.12.874081

Publication URI: http://dx.doi.org/10.1101/2019.12.12.874081

Type: Preprint