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Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. (2016)

First Author: Zhou Y

Attributed to: SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/srep21045

PubMed Identifier: 26878907

Publication URI: http://europepmc.org/abstract/MED/26878907

Type: Journal Article/Review

Volume: 6

Parent Publication: Scientific reports

ISSN: 2045-2322