Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. (2016)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/srep21045
PubMed Identifier: 26878907
Publication URI: http://europepmc.org/abstract/MED/26878907
Type: Journal Article/Review
Volume: 6
Parent Publication: Scientific reports
ISSN: 2045-2322