SECONDARY ELECTRON SPECTROSCOPY AND ENERGY SELECTIVE IMAGING FOR THE ENGINEERING OF CARBON BASED MATERIALS (2016)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Parent Publication: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation