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SECONDARY ELECTRON SPECTROSCOPY AND ENERGY SELECTIVE IMAGING FOR THE ENGINEERING OF CARBON BASED MATERIALS (2016)

First Author: Rodenburg, C.

Attributed to: SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Parent Publication: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation