Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces (2020)
Attributed to:
Measurement and characterisation of additively manufactured surface texture
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tim.2020.2967571
Publication URI: http://dx.doi.org/10.1109/tim.2020.2967571
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Instrumentation and Measurement
Issue: 9