Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes (2019)

First Author: Rackauskas B
Attributed to:  GaN Electronics: RF Reliability and Degradation Mechanisms funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2019.02.013

Publication URI: http://dx.doi.org/10.1016/j.microrel.2019.02.013

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability