Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope (2020)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab75a5
Publication URI: http://dx.doi.org/10.1088/1361-6641/ab75a5
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 5