Origin of Defect Tolerance in InAs/GaAs Quantum Dot Lasers Grown on Silicon (2020)
Attributed to:
Future Compound Semiconductor Manufacturing Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jlt.2019.2925598
Publication URI: http://dx.doi.org/10.1109/jlt.2019.2925598
Type: Journal Article/Review
Parent Publication: Journal of Lightwave Technology
Issue: 2