📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM (2019)

First Author: Macgregor TA

Attributed to: Studies of dielectric oxides as a function of field and temperature using scanning transmission electron microscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://analyticalscience.wiley.com/do/10.1002/micro.3502/full/

Type: Journal Article/Review

Parent Publication: Microscopy and Analysis