Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM (2019)
Attributed to:
Studies of dielectric oxides as a function of field and temperature using scanning transmission electron microscopy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://analyticalscience.wiley.com/do/10.1002/micro.3502/full/
Type: Journal Article/Review
Parent Publication: Microscopy and Analysis