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Near-Field Scanning Microwave Microscopy in the Single Photon Regime. (2019)

First Author: Geaney S

Attributed to: Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41598-019-48780-3

PubMed Identifier: 31467310

Publication URI: http://europepmc.org/abstract/MED/31467310

Type: Journal Article/Review

Volume: 9

Parent Publication: Scientific reports

Issue: 1

ISSN: 2045-2322