Near-Field Scanning Microwave Microscopy in the Single Photon Regime (2019)
Attributed to:
Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s41598-019-48780-3
PubMed Identifier: 31467310
Publication URI: http://europepmc.org/abstract/MED/31467310
Type: Journal Article/Review
Parent Publication: Scientific Reports
Issue: 1
ISSN: 2045-2322