Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution (2020)

First Author: Aryshev A
Attributed to:  The John Adams Institute for Accelerator Science funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/15/01/p01020

Publication URI: http://dx.doi.org/10.1088/1748-0221/15/01/p01020

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 01