Impact of Line Edge Roughness on ReRAM Uniformity and Scaling. (2019)

First Author: Constantoudis V
Attributed to:  Functional Oxide Reconfigurable Technologies (FORTE): A Programme Grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/ma12233972

PubMed Identifier: 31801205

Publication URI: http://europepmc.org/abstract/MED/31801205

Type: Journal Article/Review

Volume: 12

Parent Publication: Materials (Basel, Switzerland)

Issue: 23

ISSN: 1996-1944