📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Impact of Line Edge Roughness on ReRAM Uniformity and Scaling. (2019)

First Author: Constantoudis V

Attributed to: Functional Oxide Reconfigurable Technologies (FORTE): A Programme Grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/ma12233972

PubMed Identifier: 31801205

Publication URI: http://europepmc.org/abstract/MED/31801205

Type: Journal Article/Review

Volume: 12

Parent Publication: Materials (Basel, Switzerland)

Issue: 23

ISSN: 1996-1944