Impact of Line Edge Roughness on ReRAM Uniformity and Scaling (2019)

First Author: Constantoudis V

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/ma12233972

Publication URI: http://dx.doi.org/10.3390/ma12233972

Type: Journal Article/Review

Parent Publication: Materials

Issue: 23