Specimen preparation methods for elemental characterisation of grain boundaries and isolated dislocations in multicrystalline silicon using atom probe tomography (2017)
Attributed to:
Atom Probe Characterisation of Individual Dislocations in Multi-Crystalline Silicon
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2017.07.038
Publication URI: http://dx.doi.org/10.1016/j.matchar.2017.07.038
Type: Journal Article/Review
Parent Publication: Materials Characterization