Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon (2018)
Attributed to:
Atom Probe Characterisation of Individual Dislocations in Multi-Crystalline Silicon
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5049338
Publication URI: http://dx.doi.org/10.1063/1.5049338
Type: Conference/Paper/Proceeding/Abstract