Using non-homogeneous point process statistics to find multi-species event clusters in an implanted semiconductor (2020)

First Author: Stockbridge K
Attributed to:  Modelling impurity: impurity interactions in silicon and experimental impurity device funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/2399-6528/ab6049

Publication URI: http://dx.doi.org/10.1088/2399-6528/ab6049

Type: Journal Article/Review

Parent Publication: Journal of Physics Communications

Issue: 1