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A First Evaluation of Thick Oxide 3C-SiC MOS Capacitors Reliability (2020)

First Author: Li F

Attributed to: Ultra-high voltage (>30KV) power devices through superior materials for HVDC transmission funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2019.2954911

Publication URI: http://dx.doi.org/10.1109/ted.2019.2954911

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 1