The origin of negative charging in amorphous Al 2 O 3 films: the role of native defects (2019)
Attributed to:
HIGH END COMPUTING MATERIALS CHEMISTRY CONSORTIUM
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/ab0450
PubMed Identifier: 30716723
Publication URI: http://europepmc.org/abstract/MED/30716723
Type: Journal Article/Review
Parent Publication: Nanotechnology
Issue: 20
ISSN: 0957-4484