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Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters. (2020)

First Author: Robertson S

Attributed to: Underpinning Power Electronics 2017: Heterogeneous Integration funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12868

PubMed Identifier: 31985812

Publication URI: http://europepmc.org/abstract/MED/31985812

Type: Journal Article/Review

Volume: 279

Parent Publication: Journal of microscopy

Issue: 3

ISSN: 0022-2720