Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy. (2020)

First Author: Stock TJZ
Attributed to:  Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.9b08943

PubMed Identifier: 32142256

Publication URI: http://europepmc.org/abstract/MED/32142256

Type: Journal Article/Review

Volume: 14

Parent Publication: ACS nano

Issue: 3

ISSN: 1936-0851