A First Evaluation of Thick Oxide 3C-SiC MOS Capacitors Reliability (2020)
Attributed to:
Multi-User Equipment to Refresh Underpinning Analytical Capabilities at the University of Warwick
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2019.2954911
Publication URI: http://dx.doi.org/10.1109/ted.2019.2954911
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 1