A Novel Inspection Technique for Electronic Components Using Thermography (NITECT). (2020)

First Author: Liu H
Attributed to:  Through-life performance: From science to instrumentation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/s20175013

PubMed Identifier: 32899391

Publication URI: http://europepmc.org/abstract/MED/32899391

Type: Journal Article/Review

Volume: 20

Parent Publication: Sensors (Basel, Switzerland)

Issue: 17

ISSN: 1424-8220