Monolithically fabricated sample for the calibration of the tip-sample thermal conductance in scanning thermal microscopy (2020)
Attributed to:
Scanning thermal conduction microscopy with dual cantilever resistive probe
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1116/6.0000034
Publication URI: http://dx.doi.org/10.1116/6.0000034
Type: Journal Article/Review
Parent Publication: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Issue: 4