Monolithically fabricated sample for the calibration of the tip-sample thermal conductance in scanning thermal microscopy (2020)

First Author: Umatova Z
Attributed to:  Scanning thermal conduction microscopy with dual cantilever resistive probe funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1116/6.0000034

Publication URI: http://dx.doi.org/10.1116/6.0000034

Type: Journal Article/Review

Parent Publication: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Issue: 4