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Refining understanding of corporate failure through a topological data analysis mapping of Altman's Z-score model (2020)

First Author: Qiu W

Attributed to: Application driven Topological Data Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.eswa.2020.113475

Publication URI: http://dx.doi.org/10.1016/j.eswa.2020.113475

Type: Journal Article/Review

Parent Publication: Expert Systems with Applications