A brief review of the technological advancements of phase measuring deflectometry (2020)

First Author: Xu Y
Attributed to:  EPSRC Centre for Innovative Manufacturing in Advanced Metrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1186/s43074-020-00015-9

Publication URI: http://dx.doi.org/10.1186/s43074-020-00015-9

Type: Journal Article/Review

Parent Publication: PhotoniX

Issue: 1