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Simple technique for determining the refractive index of phase-change materials using near-infrared reflectometry (2020)

First Author: Gemo E

Attributed to: Manufacturing and Application of Next Generation Chalcogenides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/ome.395353

Publication URI: http://dx.doi.org/10.1364/ome.395353

Type: Journal Article/Review

Parent Publication: Optical Materials Express

Issue: 7