Characterization of integrated waveguides by atomic-force-microscopy-assisted mid-infrared imaging and spectroscopy. (2020)
Attributed to:
Engineering Quantum Technology Systems on a Silicon Platform
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.393748
PubMed Identifier: 32752485
Publication URI: http://europepmc.org/abstract/MED/32752485
Type: Journal Article/Review
Volume: 28
Parent Publication: Optics express
Issue: 15
ISSN: 1094-4087