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Characterization of integrated waveguides by atomic-force-microscopy-assisted mid-infrared imaging and spectroscopy (2020)

First Author: Gallacher K

Attributed to: Engineering Quantum Technology Systems on a Silicon Platform funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.393748

PubMed Identifier: 32752485

Publication URI: http://europepmc.org/abstract/MED/32752485

Type: Journal Article/Review

Parent Publication: Optics Express

Issue: 15

ISSN: 1094-4087