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Impact of BTI-Induced Threshold Voltage Shifts in Shoot-Through Currents From Crosstalk in SiC MOSFETs (2021)

First Author: Orti Gonzalez J

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2020.3012298

Publication URI: http://dx.doi.org/10.1109/tpel.2020.3012298

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 3