On-machine surface defect detection using light scattering and deep learning. (2020)

First Author: Liu M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/josaa.394102

PubMed Identifier: 32902420

Publication URI: http://europepmc.org/abstract/MED/32902420

Type: Journal Article/Review

Volume: 37

Parent Publication: Journal of the Optical Society of America. A, Optics, image science, and vision

Issue: 9

ISSN: 1084-7529