Tuning the high-? oxide (HfO2, ZrO2)/4H-SiC interface properties with a SiO2 interlayer for power device applications (2020)
Attributed to:
Integration of Novel Materials in Spintronic Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.146843
Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.146843
Type: Journal Article/Review
Parent Publication: Applied Surface Science