Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction. (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/s1600576720011929

PubMed Identifier: 33122973

Publication URI: http://europepmc.org/abstract/MED/33122973

Type: Journal Article/Review

Volume: 53

Parent Publication: Journal of applied crystallography

Issue: Pt 5

ISSN: 0021-8898