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Inspection by exception: A new machine learning-based approach for multistage manufacturing (2020)

First Author: Papananias M

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.asoc.2020.106787

Publication URI: http://dx.doi.org/10.1016/j.asoc.2020.106787

Type: Journal Article/Review

Parent Publication: Applied Soft Computing