An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB. (2020)

First Author: Zhong XL
Attributed to:  Sir Henry Royce Institute - Manchester and NNL Equipment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2020.113135

PubMed Identifier: 33129062

Publication URI: http://europepmc.org/abstract/MED/33129062

Type: Journal Article/Review

Volume: 219

Parent Publication: Ultramicroscopy

ISSN: 0304-3991