Improving the segmentation of scanning probe microscope images using convolutional neural networks (2020)
Attributed to:
Putting A Spin On Machine Learning, Atom by Atom
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2632-2153/abc81c
Publication URI: http://dx.doi.org/10.1088/2632-2153/abc81c
Type: Journal Article/Review
Parent Publication: Machine Learning: Science and Technology
Issue: 1