Electrically Erasable Optical I/O for Wafer Scale Testing of Silicon Photonic Integrated Circuits (2020)
Attributed to:
Silicon Photonics for Future Systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jphot.2020.3027799
Publication URI: http://dx.doi.org/10.1109/jphot.2020.3027799
Type: Journal Article/Review
Parent Publication: IEEE Photonics Journal
Issue: 5