DetectorChecker: analyzing patterns of defects in detector screens (2020)
Attributed to:
Inside-out: Statistical methods for Computed Tomography validation of complex structures in Additive Layer Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.21105/joss.02474
Publication URI: http://dx.doi.org/10.21105/joss.02474
Type: Journal Article/Review
Parent Publication: Journal of Open Source Software
Issue: 56