Full Control of Polarization in Ferroelectric Thin Films Using Growth Temperature to Modulate Defects (2020)

First Author: Weymann C

Attributed to: Electron Microscopy for the Characterisation and Manipulation of Advanced Functional Materials and their Interfaces at the Nanoscale funded by EPSRC

No abstract provided

Type: Journal Article/Review

Parent Publication: Advanced Electronic Materials

Issue: 12