Control of grain orientation and its impact on carrier mobility in reactively sputtered Cu2O thin films (2020)

First Author: Han S
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.tsf.2020.138000

Publication URI: http://dx.doi.org/10.1016/j.tsf.2020.138000

Type: Journal Article/Review

Parent Publication: Thin Solid Films