Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities (2020)
Attributed to:
ECCS - EPSRC Development of uniform, low power, high density resistive memory by vertical interface and defect design
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1039/d0mh00899k
Publication URI: http://dx.doi.org/10.1039/d0mh00899k
Type: Journal Article/Review
Parent Publication: Materials Horizons
Issue: 11