Real-time in situ optical tracking of oxygen vacancy migration in memristors (2020)

First Author: Di Martino G
Attributed to:  Equipment Account: Integrated Thin Film Deposition and Analysis System funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41928-020-00478-5

Publication URI: http://dx.doi.org/10.1038/s41928-020-00478-5

Type: Journal Article/Review

Parent Publication: Nature Electronics

Issue: 11