Real-time in situ optical tracking of oxygen vacancy migration in memristors (2020)
Attributed to:
ECCS - EPSRC Development of uniform, low power, high density resistive memory by vertical interface and defect design
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1038/s41928-020-00478-5
Publication URI: http://dx.doi.org/10.1038/s41928-020-00478-5
Type: Journal Article/Review
Parent Publication: Nature Electronics
Issue: 11