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Charge fluctuations at the Si-SiO2 interface and its effect on surface recombination in solar cells (2020)

First Author: Bonilla R

Attributed to: Improved surface passivation for semiconductor solar cells funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.solmat.2020.110649

Publication URI: http://dx.doi.org/10.1016/j.solmat.2020.110649

Type: Journal Article/Review

Parent Publication: Solar Energy Materials and Solar Cells