Charge fluctuations at the Si-SiO2 interface and its effect on surface recombination in solar cells (2020)
Attributed to:
Improved surface passivation for semiconductor solar cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.solmat.2020.110649
Publication URI: http://dx.doi.org/10.1016/j.solmat.2020.110649
Type: Journal Article/Review
Parent Publication: Solar Energy Materials and Solar Cells