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A more holistic characterisation of internal interfaces in a variety of materials via complementary use of transmission Kikuchi diffraction and Atom probe tomography (2020)

First Author: Jenkins B

Attributed to: Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.147011

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.147011

Type: Journal Article/Review

Parent Publication: Applied Surface Science