A more holistic characterisation of internal interfaces in a variety of materials via complementary use of transmission Kikuchi diffraction and Atom probe tomography (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2020.147011

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2020.147011

Type: Journal Article/Review

Parent Publication: Applied Surface Science