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Site-specific specimen preparation for SIMS analysis of radioactive samples. (2021)

First Author: Liu J

Attributed to: Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12981

PubMed Identifier: 33196102

Publication URI: http://europepmc.org/abstract/MED/33196102

Type: Journal Article/Review

Volume: 282

Parent Publication: Journal of microscopy

Issue: 1

ISSN: 0022-2720