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Electrical Characterization of Thermally Activated Defects in n -Type Float-Zone Silicon (2021)

First Author: Zhu Y

Attributed to: Gettering of impurities in silicon: delivering quantitative understanding to improve photovoltaics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2020.3031382

Publication URI: http://dx.doi.org/10.1109/jphotov.2020.3031382

Type: Journal Article/Review

Parent Publication: IEEE Journal of Photovoltaics

Issue: 1