Electrical Characterization of Thermally Activated Defects in n -Type Float-Zone Silicon (2021)

First Author: Zhu Y
Attributed to:  SuperSilicon PV: extending the limits of material performance funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2020.3031382

Publication URI: http://dx.doi.org/10.1109/jphotov.2020.3031382

Type: Journal Article/Review

Parent Publication: IEEE Journal of Photovoltaics

Issue: 1